10-15 July 2022 • Denver, Colorado, USA


10-15 July 2022 • Denver, Colorado, USA


W-band Dielectric Characterization of Automotive Paint

Abdelhamid Nasr, Kamal Sarabandi, university of michigan, United States

Microwave Characterization of Material Properties

AP-S: Electromagnetics & Materials

Capitol Ballroom 7 (HR)

Presentation Time:
Thu, 14 Jul, 09:00 - 09:20 Denver Time (UTC -7)

Session Co-Chairs:
Jon Wallace, Sandia National Laboratories and Rosalind Agasti, University of Oklahoma
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Session TH-A2.3A
TH-A2.3A.1: Non-Aligned Biaxial Media Theoretical Scattering Parameter Extraction
Jeffrey Massman, Air Force Research Laboratory, United States; Michael Havrilla, Air Force Institute of Technology, United States
TH-A2.3A.2: Estimating effective contact resistance of resonant cavity joints using near-field scanning
Jon Wallace, Ian Timmins, Sandia National Laboratories, United States
TH-A2.3A.3: Characterization and Sensing of Milk Fat% in the Low GHz Band
Ala Eldin Omer, CIARS, University of Waterloo, Canada; Jessica Chong, Lisa Chen, George Shaker, University of Waterloo, Canada
TH-A2.3A.4: W-band Dielectric Characterization of Automotive Paint
Abdelhamid Nasr, Kamal Sarabandi, university of michigan, United States
TH-A2.3A.5: Characterization of Camouflage Radome Materials for Recent and Future Communication Antennas
Sulaiman Alsuwailem, Prince Sultan Defense Studies and Research Center (PSDSARC), Saudi Arabia; Muhammad Ashraf, Mohammed Alzabidi, Khalid Jamil, PSDSARC, Saudi Arabia
TH-A2.3A.6: Radio-Frequency Characterization of Thermally and Electrically Conductive Adhesives for Antenna Applications
Rosalind Agasti, Adrian Bauer, Hjalti Sigmarsson, Jessica Ruyle, University of Oklahoma, United States
TH-A2.3A.7: Non-Destructive Olive Tree Dielectric Properties Characterization by Using an Open-ended Coaxial Probe
Valeria Lazzoni, Agostino Monorchio, University of Pisa / CNIT, Italy; Eliana Canicattì, Danilo Brizi, University of Pisa/ RaSS Lab- CNIT, Italy; Riccardo Rossi, Marco Bindi, Università degli Studi di Firenze, Italy; Marco Moriondo, CNR, Italy
TH-A2.3A.8: Dielectric Constant Estimation Using Calibration-Free Reflected Voltage Measurements
Hassan Shwaykani, Joseph Costantine, Ali El-Hajj, American University of Beirut, Lebanon; Mohammed Al-Husseini, Lebanese Center for Studies and Research, Lebanon
TH-A2.3A.9: Dielectric Properties Extraction using Complementary Metamaterial Sensor with Enhanced Performance
Waseem Shahzad, Wei Hu, Qasim Ali, Beijing Institute of Technology Beijing, China; Arslan Kiyani, Syed Muzahir Abbas, Macquarie University, Australia
TH-A2.3A.10: A low-cost and fast resonant cavity watercut meter using amplitude measurement
Aria Modaber, Sommayyeh Chamaani, Khajeh Nasir Toosi University of Technology, Iran
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