10-15 July 2022 • Denver, Colorado, USA

IEEE AP-S/URSI 2022

10-15 July 2022 • Denver, Colorado, USA

TH-A2.1P.3

Online Examination and Self-Assessment Tool for EM Teaching

Alessandro Polo, Nicola Anselmi, Renzo Azaro, Giacomo Oliveri, Lorenzo Poli, Paolo Rocca, Marco Salucci, Andrea Massa, ELEDIA@UniTN - University of Trento, Italy; Hanen Ahmadi, ELEDIA@Innov'COM – Sup'COM, Tunisia; Jin Huang, Peng Li, ELEDIA@XIDIAN - Xidian University, China; Maokun Li, ELEDIA@TSINGHUA - Tsinghua University, China; Sotirios Goudos, ELEDIA@AUTH – Aristotle University of Thessaloniki, China; Shiwen Yang, ELEDIA@UESTC - UESTC, China
Session:
Educational Tools and Laboratories in Electromagnetics
Track:
AP-S: Electromagnetics & Materials
Location:
Mineral Hall C (HR)
Presentation Time:
Thu, 14 Jul, 14:00 - 14:20 Denver Time (UTC -6)
Session Co-Chairs:
David Kelley, Bucknell University and Paolo Rocca, ELEDIA@UniTN - University of Trento
Presentation
Discussion
Session TH-A2.1P
TH-A2.1P.1: Calculating S-Parameters Using Only Port Voltages
David Kelley, Bucknell University, United States
TH-A2.1P.2: An Effective Sequence of VNA Experiments for a Junior-Level Electromagnetics Course
Steven Holland, Donovan Brocker, Robert Strangeway, Milwaukee School of Engineering, United States
TH-A2.1P.3: Online Examination and Self-Assessment Tool for EM Teaching
Alessandro Polo, Nicola Anselmi, Renzo Azaro, Giacomo Oliveri, Lorenzo Poli, Paolo Rocca, Marco Salucci, Andrea Massa, ELEDIA@UniTN - University of Trento, Italy; Hanen Ahmadi, ELEDIA@Innov'COM – Sup'COM, Tunisia; Jin Huang, Peng Li, ELEDIA@XIDIAN - Xidian University, China; Maokun Li, ELEDIA@TSINGHUA - Tsinghua University, China; Sotirios Goudos, ELEDIA@AUTH – Aristotle University of Thessaloniki, China; Shiwen Yang, ELEDIA@UESTC - UESTC, China
TH-A2.1P.4: Revisiting the Eiffel Tower Antenna in 1911
Ted Simpson, University of South Carolina, United States; Bill Liles, Liles Innovations LLC, United States
TH-A2.1P.5: Performance Evaluation of an In-house Developed Characteristic Mode Analysis Tool
Saurabh Shukla, A. R. Harish, Indian Institute of Technology Kanpur, India; Kapil Saraswat, Central University of Rajasthan, India
Resources
No resources available.